Intrinsic stress analysis of tungsten-lined open TSVs

نویسندگان

  • Lado Filipovic
  • Anderson Pires Singulani
  • Frederic Roger
  • Sara Carniello
  • Siegfried Selberherr
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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015